The Mini-Z series of compact benchtop wavelength dispersive XRF analyzers are designed for analyzing specific elements. Since the optics are optimally configured to a particular element, this series allows for high precision and ease of analysis. The Sulfur analyzer is configured for analysis of S in fuel oil, gasoline, diesel, etc., meets the 15 ppm EPA regulation, and has a LLD (lower limit of detection) of 0.3 ppm.

This instrument can also be configured as a Si analyzer (e.g., for coated Si on paper or plastic), an Al analyzer (e.g., for coated Al on paper or plastic), a Ni analyzer, (e.g., for Ni coating or plating) and a Zr analyzer (e.g., for Zr coating).

Features

• Excellent LLD
• Peak and background measurements
• Easy-to-operate software
• No cooling water, plug-n-play
• Light weight and compact body
• Exceptional repeatability
• Wide analysis range
• High-resolution, wavelength dispersive optics
• No complex sample preparation required (reagent treatment, etc.)