Seiko SFT110 XRF Coating Thickness analyser
The Long awaiting cost effective Coating Thickness has arrived in the shape of the SFT110.
Key Features:
- 50 kV 1 mA tungsten tube, air cooled
- Large measuring chamber (option: slotted)
- Selection of sample stages (manual or motorized)
- Autofocus and auto positioning system
- Second camera for wide view observation
- Multi collimator changer
- A choice of detectors (prop counter to SDD)
More details:
1. Easy setting
Optical image of the sample automatically appeares on the display once the sample is placed on the stage.
2. 50nm Au plating thickness can be measured precisely in 10 seconds
Optimum geometry achieves higher sensitivity even under micro beam, which enables better measurement accuracy with round 0.1 or 0.2 mm collimator.
3. Measurement without the standard sample.
Measurement can be done without thickness standard sample(s) by expanding the FP software. Measurement of multilayer film and alloy film can be done easily.
4. Easy positioning by Wide View System
New Wide View System (option) which enables the user to observe the whole sample image (size max. 250x200mm), makes easy setting of the measurement position.
Need more information:
For further information, prices or if you want to talk to someone at SciMed about this product please click here.
Further information in the Seiko website can be found here (click on logo).
You can also visit our dedicated XRF Website: www.scimed-xrf.co.uk.

